<p>Olympus this week announced the release of the LEXT OLS4100 laser confocal microscope system. Designed to deliver nanometer-level imaging, accurate 3D measurement, and outstanding surface roughness analysis, the OLS4100 features auto brightness and a new high-speed stitching mode.</p><p>Engineered to meet a growing demand for increased measurement precision and wider observation applicability, the OLS4100 offers advanced measurement performance at ten-nanometer resolution with a variety of user-friendly performance parameters. Thanks to high numerical apertures and a dedicated optical system that obtains maximum performance from a 405 nm laser, the OLS4100 can reliably measure acute-angled samples that were previously impossible to measure.</p><p>"Widely used in quality control, research, and development across an array of industries and applications, OLYMPUS LEXT laser microscopes set a new standard in 3D laser microscopy," said Matt Smith, Olympus director of sales and marketing. "Today, with the LEXT OLS4100, Olympus is once again raising the bar with a new level of precision and ease of use."</p><p>The OLS4100's auto brightness setting is part of an automatic 3D image acquisition system that allows even first-time users to quickly acquire 3D images with the click of a button, greatly reducing image acquisition time. A new high-speed stitching mode allows the user to specify target areas from wider-area stitched images.</p><p><a href="http://www.electroiq.com/articles/sst/2013/06/olympus-launches-lext-ols4100-laser-confocal-microscope.html">Keep reading...</a></p>